Text| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | |
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Reference Book
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Amity Central Library ASET ECE | Reference | 621.395 WAN-V (Browse shelf(Opens below)) | Link to resource | Not For Loan | 23314 |
Browsing Amity Central Library shelves, Shelving location: ASET ECE, Collection: Reference Close shelf browser (Hides shelf browser)
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| 621.395 ROY-L Low-Power CMOS VLSI Circuit Design | 621.395 SHE-A Algorithms for VLSI Physical Design Automation | 621.395 VLS-V VLSI Circuits and Systems in Silicon | 621.395 WAN-V VLSI Test Principles and Architecture Design for Textability | 621.395028551 MIC-S Synthesis and Optimization of Digital Circuits | 621.39732 LEE-D Design of CMOS Radio Frequency Integrated | 621.3981 PET-I Introduction to Spread Spectrum Communication |
Chapter 1 – Introduction Chapter 2 – Design for Testability Chapter 3 – Logic and Fault Simulation Chapter 4 – Test Generation Chapter 5 – Logic Built-In Self-Test Chapter 6 – Test Compression Chapter 7 – Logic Diagnosis Chapter 8 – Memory Testing and Built-In Self-Test Chapter 9 – Memory Diagnosis and Built-In Self-Repair Chapter 10 – Boundary Scan and Core-Based Testing Chapter 11 – Analog and Mixed-Signal Testing Chapter 12 – Test Technology Trends in the Nanometer Age
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