Text| Item type | Current library | Collection | Call number | URL | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Reference Book
|
Amity Central Library ASET ECE | Reference | 621.395 WAN-V (Browse shelf(Opens below)) | Link to resource | Not For Loan | 23314 |
Chapter 1 – Introduction Chapter 2 – Design for Testability Chapter 3 – Logic and Fault Simulation Chapter 4 – Test Generation Chapter 5 – Logic Built-In Self-Test Chapter 6 – Test Compression Chapter 7 – Logic Diagnosis Chapter 8 – Memory Testing and Built-In Self-Test Chapter 9 – Memory Diagnosis and Built-In Self-Repair Chapter 10 – Boundary Scan and Core-Based Testing Chapter 11 – Analog and Mixed-Signal Testing Chapter 12 – Test Technology Trends in the Nanometer Age
Details
There are no comments on this title.
Log in to your account to post a comment.