| 000 | 01150nam a22001697a 4500 | ||
|---|---|---|---|
| 999 |
_c35464 _d35464 |
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| 003 | OSt | ||
| 020 | _a9789380501550 | ||
| 082 | _a621.395 WAN-V | ||
| 100 | _aWang, Laung-Terng | ||
| 245 | _aVLSI Test Principles and Architecture Design for Textability | ||
| 260 |
_aNew York _bElsevier _c2006 |
||
| 300 | _a777p. | ||
| 500 | _aChapter 1 – Introduction Chapter 2 – Design for Testability Chapter 3 – Logic and Fault Simulation Chapter 4 – Test Generation Chapter 5 – Logic Built-In Self-Test Chapter 6 – Test Compression Chapter 7 – Logic Diagnosis Chapter 8 – Memory Testing and Built-In Self-Test Chapter 9 – Memory Diagnosis and Built-In Self-Repair Chapter 10 – Boundary Scan and Core-Based Testing Chapter 11 – Analog and Mixed-Signal Testing Chapter 12 – Test Technology Trends in the Nanometer Age Details | ||
| 856 | _uhttps://books.google.co.in/books?id=P1ea4znZhGsC&printsec=frontcover&dq=vlsi+test+principles+and+architectures+by+wang&hl=en&sa=X&ved=0ahUKEwjDyqGL27DhAhUHS48KHfFDBfkQ6AEIKzAA#v=onepage&q=vlsi%20test%20principles%20and%20architectures%20by%20wang&f=false | ||
| 901 | _a23314 | ||
| 942 |
_2ddc _cBK |
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