000 00409nam a2200181Ia 4500
008 140910s9999 xx 000 0 und d
082 _a621.381
082 _bABR - D
100 _aAbramovici, Miron Ed
245 _aDigital System Testing & Testable Design
260 _aNew Delhi
260 _bJaico
260 _c2001
300 _a652p
650 _aELECTRONICS
942 _2DDC
942 _cBook
999 _c17857
_d17857