Digital Systems Testing and Testable Design
Material type:
TextPublication details: Delhi Jaico Pub. 2001Description: 652p
| Item type | Current library | Call number | URL | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Books
|
Amity Central Library ASET ECE | 621.3815 ABR-D (Browse shelf(Opens below)) | Link to resource | Available | 22118 | ||
|
Books
|
Amity Central Library ASET ECE | 621.3815 ABR-D (Browse shelf(Opens below)) | Link to resource | Available | 22119 |
Browsing Amity Central Library shelves, Shelving location: ASET ECE Close shelf browser (Hides shelf browser)
|
|
|
No cover image available | No cover image available |
|
|
||
| 621.38132 CHO-L Linear Integrated Circuits | 621.38132 CHO-L Linear Integrated Circuits | 621.38132 CHO-L Linear Integrated Circuits | 621.3815 ABR-D Digital Systems Testing and Testable Design | 621.3815 ABR-D Digital Systems Testing and Testable Design | 621.3815 ALL-C CMOS Analog Circuit Design | 621.3815 ALL-C CMOS Analog Circuit Design |
There are no comments on this title.
Log in to your account to post a comment.